Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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178 results for Wilfried Haensch

On the high-field transport and its temperature dependence in deca-nanometer fully depleted silicon-on-insulator field-effect-transistor
- - Masaharu Kobayashi
  - Jin Cai
  - et al.
- 2011
- Applied Physics Letters
High-frequency graphene voltage amplifier
- - Shu-Jen Han
  - Keith A. Jenkins
  - et al.
- 2011
- Nano Letters
Large-scale graphene transistors with enhanced performance and reliability based on interface engineering by phenylsilane self-assembled monolayers
- - Zihong Liu
  - Ageeth A. Bol
  - et al.
- 2011
- Nano Letters
On the possibility of obtaining MOSFET-like performance and Sub-60-mV/dec swing in 1-D broken-gap tunnel transistors
- - Siyuranga O. Koswatta
  - Steven J. Koester
  - et al.
- 2010
- IEEE T-ED
Effects of substrate orientation and channel stress on short-channel thin SOI MOSFETs
- - Amlan Majumdar
  - Christine Ouyang
  - et al.
- 2010
- IEEE T-ED
Practical strategies for power-efficient computing technologies
- - Leland Chang
  - David J. Frank
  - et al.
- 2010
- Proceedings of the IEEE
Hydrogen silsesquioxane-based hybrid electron beam and optical lithography for high density circuit prototyping
- - M. Guillorn
  - J. Chang
  - et al.
- 2009
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Undoped-body extremely thin SOI MOSFETs with back gates
- - Amlan Majumdar
  - Zhibin Ren
  - et al.
- 2009
- IEEE Transactions on Electron Devices
Investigation of thermal crosstalk between SOI FETs by the subthreshold sensing technique
- - Manu Shamsa
  - Paul M. Solomon
  - et al.
- 2008
- IEEE Transactions on Electron Devices
An 8T-SRAM for variability tolerance and low-voltage operation in high-performance caches
- - Leland Chang
  - Robert K. Montoye
  - et al.
- 2008
- IEEE Journal of Solid-State Circuits