Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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2 results for Lou Medina

Front-end-of-line quadrature-clocked voltage-dependent capacitance measurement
- - Stas Polonsky
  - Paul Solomon
  - et al.
- 2011
- ICMTS 2011
New tools and methodology for advanced parametric and defect structure test
- - Raphael Robertazzi
  - Louis Medina
  - et al.
- 2010
- IEEE ITC 2010