Assessment of XRF technique as a method to measure percent ag in SnAg solders for flip chip applications
- Jennifer D. Schuler
- Chia-Hsin Shih
- et al.
- 2012
- IMAPS 2012
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.