Collector turret for scanning electron microscope
- Oliver C. Wells
- Conrad G. Bremer
- 2003
- Review of Scientific Instruments
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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52 results for O.C. Wells
Low-loss image for surface scanning electron microscope
- Oliver C. Wells
- 2003
- Applied Physics Letters
Coating, mechanical constraints, and pressure effects on electromigration
- N.G. Ainslie
- F.M. D'Heurle
- et al.
- 2003
- Applied Physics Letters
Reversible hillock growth in thin films
- S.K. Lahiri
- O.C. Wells
- 2003
- Applied Physics Letters
New contrast mechanism for scanning electron microscope
- Oliver C. Wells
- 2003
- Applied Physics Letters
An irradiation effect in thermally grown SiO2
- Oliver C. Wells
- 2003
- Applied Physics Letters
Method for examining solid specimens with improved resolution in the scanning electron microscope (SEM)
- O.C. Wells
- A.N. Broers
- et al.
- 2003
- Applied Physics Letters
Improved energy analyser for the scanning electron microscope
- O.C. Wells
- C.G. Bremer
- 2002
- Journal of Physics E: Scientific Instruments
Voltage measurement in the scanning electron microscope
- O.C. Wells
- C.G. Bremer
- 2002
- Journal of Physics E: Scientific Instruments
Application of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samples
- Oliver C. Wells
- Maurice McGlashan-Powell
- et al.
- 2001
- Scanning