Studies of samples having shallow surface topography by the low-loss electron (LLE) method in the scanning electron microscope (SEM)
- O.C. Wells
- Maurice McGlashen-Powell
- et al.
- 2000
- Scanning
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.