Resistance monitoring and effects of nonadhesion during electromigration in aluminum films
- R. Rosenberg
- L. Berenbaum
- 2003
- Applied Physics Letters
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2 results for L. Berenbaum
Surface topology changes during electromigration in metallic thin film stripes
- L. Berenbaum
- R. Rosenberg
- 1969
- Thin Solid Films