The physics of hot-electron degradation of Si MOSFET's: Can we understand it?
- M.V. Fischetti
- S.E. Laux
- et al.
- 1989
- Applied Surface Science
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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119 results for D.J. DiMaria
An electron paramagnetic resonance study of electron injected oxides in metal-oxide-semiconductor capacitors
- L.P. Trombetta
- G.J. Gerardi
- et al.
- 1988
- Journal of Applied Physics
Vacuum emission of hot electrons from silicon dioxide at low temperatures
- D.J. DiMaria
- M.V. Fischetti
- 1988
- Journal of Applied Physics
Hot electrons in SiO2: ballistic to steady-state transport
- M.V. Fischetti
- D.J. DiMaria
- 1988
- Solid State Electronics
Correlation of trap creation with electron heating in silicon dioxide
- D.J. Dimaria
- 1987
- Applied Physics Letters
Ballistic electron transport in thin silicon dioxide films
- M.V. Fischetti
- D.J. Dimaria
- et al.
- 1987
- Physical Review B
Hot electrons in silicon dioxide: Ballistic to steady-state transport
- D.J. DiMaria
- M.V. Fischetti
- 1987
- Applied Surface Science
A Permeable-Base Switching Device Using Stacked Layers of Silicon, Silicon Dioxide, and Silicon-Rich Silicon Dioxide
- D.J. Dimaria
- Maurizio Arienzo
- 1987
- IEEE T-ED
Electron heating studies in silicon dioxide: Low fields and thick films
- D.J. DiMaria
- M.V. Fischetti
- et al.
- 1986
- Journal of Applied Physics
Electron heating in silicon nitride and silicon oxynitride films
- D.J. DiMaria
- J.R. Abernathey
- 1986
- Journal of Applied Physics