Capture and emission of electrons at 2.4-eV-deep trap level in SiO2 films
- D.J. DiMaria
- F.J. Feigl
- et al.
- 1975
- Physical Review B
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.