Simulation of Impurity Freezeout Through Numerical Solution of Poisson's Equation with Application to MOS Device Behavior
- Richard C. Jaeger
- Fritz H. Gaensslen
- 1980
- IEEE T-ED
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14 results for Fritz H. Gaensslen
1 µm MOSFET VLSI Technology: Part 11—Device Designs and Characteristics for High-Performance Logic Applications
- Robert H. Dennard
- Fritz H. Gaensslen
- et al.
- 1979
- IEEE T-ED
Temperature dependent threshold behavior of depletion mode MOSFETs. Characterization and simulation
- F.H. Gaensslen
- R.C. Jaeger
- 1979
- Solid-State Electronics
Very Small MOSFET's for Low-Temperature Operation
- Fritz H. Gaensslen
- V. Leo Rideout
- et al.
- 1977
- IEEE T-ED