Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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31 results for D.R. Young

Hydrogen migration under avalanche injection of electrons in Si metal-oxide-semiconductor capacitors
- - R. Gale
  - F.J. Feigl
  - et al.
- 1983
- Journal of Applied Physics
The effects of water on oxide and interface trapped charge generation in thermal SiO₂ films
- - F.J. Feigl
  - D.R. Young
  - et al.
- 1981
- Journal of Applied Physics
Identification of electron traps in thermal silicon dioxide films
- - A. Hartstein
  - D.R. Young
- 1981
- Applied Physics Letters
Reduction of electron trapping in silicon dioxide by high-temperature nitrogen anneal
- - S.K. Lai
  - D.R. Young
  - et al.
- 1981
- Journal of Applied Physics
Characterization of electron traps in SiO₂ as influenced by processing parameters
- - D.R. Young
- 1981
- Journal of Applied Physics
Effects of avalanche injection of electrons into silicon dioxide - Generation of fast and slow interface states
- - S.K. Lai
  - D.R. Young
- 1981
- Journal of Applied Physics
Detection of impurities on silicon surfaces
- - D.J. DiMaria
  - W. Reuter
  - et al.
- 1981
- Journal of Applied Physics
The electron trapping behavior of silicon dioxide with ion implanted aluminum
- - D.R. Young
  - D.J. DiMaria
  - et al.
- 1977
- Journal of Electronic Materials
Use of photocurrent-voltage characteristics of MOS structures to determine insulator bulk trapped charge densities and centroids
- - D.J. DiMaria
  - Z.A. Weinberg
  - et al.
- 1977
- Journal of Electronic Materials
Avalanche injection of holes into SiO2
- - J.M. Aitken
  - D.R. Young
- 1977
- IEEE TNS