IIB-4 Gate-Self-Aligned n-channel and p-channel Germanium MOSFET'S
- C.M. Ransom
- T.N. Jackson
- et al.
- 1991
- IEEE T-ED
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
Date
Featured collections
Popular topics
465 results at IEEE T-ED
The Design and Optimization of High-Performance, Double-Poly Self-Aligned p-n-p Technology
- Pong-Fei Lu
- James D. Warnock
- et al.
- 1991
- IEEE T-ED
Monte Carlo Simulation of Transport in Technologically Significant Semiconductors of the Diamond and Zinc-Blende Structures—Part I Homogeneous Transport
- Massimo V. Fischetti
- 1991
- IEEE T-ED
Reply To “Comments On 'Unilateral Gain Of Heterojunction Bipolar Transistors At Microwave Frequencies'”
- Sheila Prasad
- Wai Lee
- et al.
- 1990
- IEEE T-ED
On the Scaling Property of Trench Isolation Capacitance for Advanced High-Performance ECL Circuits
- P.F. Lu
- C.T. Chuang
- 1990
- IEEE T-ED
Scaling The Silicon Bipolar Transistor For Sub-100-Ps Ecl Circuit Operation At Liquid Nitrogen Temperature
- John D. Cressler
- Tze-Chiang Chen
- et al.
- 1990
- IEEE T-ED
On the Very-High-Current Degradations on Si n-p-n Transistors
- Denny Duan-Lee Tang
- Edward Hackbarth
- et al.
- 1990
- IEEE T-ED
One-Dimensional All Injection Nonquasi-static Models for Arbitrarily Doped Quasi-neutral Layers in Bipolar Junction Transistors Including Plasma-Induced Energy-Gap Narrowing
- Ben S. Wu
- Fredrik A. Lindholm
- 1990
- IEEE T-ED
Frequency Response of Advanced Silicon Bipolar Transistors at Low Temperature
- Keith A. Jenkins
- 1990
- IEEE T-ED
Avalanche Electron Injection in 4-nm Si3N4/8-nm SiO2 Dielectric Structure: Turn-Around Phenomenon and Si-SiO2 Interface Degradation
- Leonello Dori
- Maurizio Severi
- et al.
- 1990
- IEEE T-ED