Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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2355 results at Journal of Applied Physics

X-ray photoelectron spectroscopy study on Fe and Co catalysts during the first stages of ethanol chemical vapor deposition for single-walled carbon nanotube growth
- - Satoshi Oida
  - Fenton R. McFeely
  - et al.
- 2011
- Journal of Applied Physics
Characterizing the effects of etch-induced material modification on the crystallization properties of nitrogen doped Ge₂Sb₂Te ₅
- - J.S. Washington
  - Eric A. Joseph
  - et al.
- 2011
- Journal of Applied Physics
The effect of interface processing on the distribution of interfacial defect states and the C-V characteristics of III-V metal-oxide-semiconductor field effect transistors
- - Cheng-Wei Cheng
  - George Apostolopoulos
  - et al.
- 2011
- Journal of Applied Physics
A quantitative analysis of room temperature recrystallization kinetics in electroplated copper films using high resolution x-ray diffraction
- - Andrew Ying
  - Christian Witt
  - et al.
- 2011
- Journal of Applied Physics
Determination of band offsets, chemical bonding, and microstructure of the (_Tbx_{Sc1-x) 2} O₃ /Si system
- - I. Geppert
  - M. Eizenberg
  - et al.
- 2010
- Journal of Applied Physics
Universality of Zener tunneling in homojunction p-ⁿ diodes
- - Amlan Majumdar
  - Isaac Lauer
  - et al.
- 2010
- Journal of Applied Physics
Metastable phase formation during the reaction of Ni films with Si(001): The role of texture inheritance
- - Simon Gaudet
  - C. Coia
  - et al.
- 2010
- Journal of Applied Physics
Perpendicular-field magnetoresistance and thermal-ferromagnetic resonance measurement of easy-plane anisotropy in nanostructured magnetic tunnel junctions
- - M.D. Mascaro
  - J.Z. Sun
- 2010
- Journal of Applied Physics
The impact of film thickness and melt-quenched phase on the phase transition characteristics of Ge₂ Sb₂ Te₅
- - Huai-Yu Cheng
  - Simone Raoux
  - et al.
- 2010
- Journal of Applied Physics
Investigation on critical failure thickness of hydrogenated/nonhydrogenated amorphous silicon films
- - Jeehwan Kim
  - Daniel Inns
  - et al.
- 2010
- Journal of Applied Physics