Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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20 results at IRPS 2004

Degradation of ultra-thin oxides with tungsten gates under high voltage: Wear-out and breakdown transient
- - F. Palumbo
  - S. Lombardo
  - et al.
- 2004
- IRPS 2004
Comprehensive reliability evaluation of a 90 nm CMOS technology with Cu/PECVD low-k BEOL
- - D. Edelstein
  - H.S. Rathore
  - et al.
- 2004
- IRPS 2004
Measurements of effective thermal conductivity for advanced interconnect structures with various composite low-k dielectrics
- - F. Chen
  - J. Gill
  - et al.
- 2004
- IRPS 2004
Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs
- - K. Chatty
  - P.E. Cottrell
  - et al.
- 2004
- IRPS 2004
Broad energy distribution of NBTI-induced interface states in p-MOSFETs with ultra-thin nitrided oxide
- - J.H. Stathis
  - G. Larosa
  - et al.
- 2004
- IRPS 2004
SRAM ser in 90, 130 and 180 nm bulk and SOI technologies
- - Ethan H. Cannon
  - Daniel D. Reinhardt
  - et al.
- 2004
- IRPS 2004
Reliability and design qualification of a sub-micron tungsten silicide E-Fuse
- - W.R. Tonti
  - J.A. Fifield
  - et al.
- 2004
- IRPS 2004
Effects of overlayers on electromigration reliability improvement for Cu/low K interconnects
- - C.-K. Hu
  - D. Canaperi
  - et al.
- 2004
- IRPS 2004
Magnetoresistive random access memory (MRAM) and reliability
- - Brian Hughes
- 2004
- IRPS 2004
Thermal cycle reliability of stacked via structures with copper metallization and an organic low-k dielectric
- - R. Filippi
  - J.F. McGrath
  - et al.
- 2004
- IRPS 2004