Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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465 results at IEEE T-ED

Heterogeneous integration of III-V materials by direct wafer bonding for high-performance electronics and optoelectronics
- - Daniele Caimi
  - Preksha Tiwari
  - et al.
- 2021
- IEEE T-ED
Spatially Resolved Diffusion of Aluminum in 4H-SiC during Postimplantation Annealing
- - Johanna Muting
  - Viktor Bobal
  - et al.
- 2020
- IEEE T-ED
Impact of hot-carrier degradation on drain-induced barrier lowering in multifin SOI n-Channel FinFETs with self-heating
- - Charu Gupta
  - Anshul Gupta
  - et al.
- 2020
- IEEE T-ED
Facts and Myths of Dielectric Breakdown Processes-Part II: Post-Breakdown and Variability
- - Ernest Y. Wu
- 2019
- IEEE T-ED
Facts and Myths of Dielectric Breakdown Processes-Part I: Statistics, Experimental, and Physical Acceleration Models
- - Ernest Y. Wu
- 2019
- IEEE T-ED
Low-Noise Schottky Junction Trigate Silicon Nanowire Field-Effect Transistor for Charge Sensing
- - Xi Chen
  - Si Chen
  - et al.
- 2019
- IEEE T-ED
Reliability Modeling and Analysis of Hot-Carrier Degradation in Multiple-Fin SOI n-Channel FinFETs With Self-Heating
- - Anshul Gupta
  - Charu Gupta
  - et al.
- 2019
- IEEE T-ED
Investigation of Pt-Salt-Doped-Standalone-Multiwall Carbon Nanotubes for On-Chip Interconnect Applications
- - Jie Liang
  - Rongmei Chen
  - et al.
- 2019
- IEEE T-ED
A study on OTS-PCM pillar cell for 3-d stackable memory
- - W. Chien
  - C. Yeh
  - et al.
- 2018
- IEEE T-ED
Modeling of Effective Thermal Resistance in Sub-14-nm Stacked Nanowire and FinFETs
- - Ishita Jain
  - Anshul Gupta
  - et al.
- 2018
- IEEE T-ED