Analysis of grain-boundary electromigration
- P.S. Ho
- 2008
- Journal of Applied Physics
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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2355 results at Journal of Applied Physics
Effects of substrate bias and annealing on the properties of amorphous alloy films of Gd-Co, Gd-Fe, and Gd-Co-X (X=Mo,Cu,Au)
- Neil Heiman
- N. Kazama
- et al.
- 2008
- Journal of Applied Physics
Analysis of resonance phenomena in Josephson interferometer devices
- H.H. Zappe
- B.S. Landman
- 2008
- Journal of Applied Physics
Microstructure and Schottky barrier height of iridium silicides formed on silicon
- I. Ohdomari
- T.S. Kuan
- et al.
- 2008
- Journal of Applied Physics
Young's modulus measurements of thin films using micromechanics
- Kurt E. Petersen
- C.R. Guarnieri
- 2008
- Journal of Applied Physics
The inductance of a superconducting strip transmission line
- W.H. Chang
- 2008
- Journal of Applied Physics
Fundamental criteria for the design of high-performance Josephson nondestructive readout random access memory cells and experimental confirmation
- W.H. Henkels
- 2008
- Journal of Applied Physics
In situ Auger electron spectroscopy of Si and SiO2 surfaces plasma etched in CF4-H2 glow discharges
- J.W. Coburn
- 2008
- Journal of Applied Physics
Growth and dissolution kinetics of III-V heterostructures formed by LPE
- M.B. Small
- R. Ghez
- 2008
- Journal of Applied Physics
Influence of preparation conditions on forward-bias currents of amorphous silicon Schottky diodes
- A. Deneuville
- M.H. Brodsky
- 2008
- Journal of Applied Physics