Repassivation Transients Measured with the Breaking-Electrode Technique on Aluminum Thin-Film Samples
- C.V. Jahnes
- V. Brusic
- et al.
- 1995
- JES
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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509 results at JES
Electrochemical Fabrication of Mechanically Robust PbSn C4 Interconnections
- J. Roeder
- H. Deligianni
- et al.
- 1995
- JES
Fabrication of an array of precision nozzles by through-mask electrochemical micromachining
- Madhav Datta
- 1995
- JES
PECVD Silicon Nitride as a Gate Dielectric for Amorphous Silicon Thin Film Transistor Process and Device Performance
- Yue Kuo
- 1995
- JES
Laser-Assisted Seeding for Electroless Plating on Polyimide Surfaces
- A.G. Schrott
- Bodil Braren
- et al.
- 1995
- JES
Plasma Etching and Deposition for a-Si: H Thin Film Transistors
- Yue Kuo
- 1995
- JES
Screening of charged electrodes in aqueous electrolytes
- James N. Glosli
- 1995
- JES
Shallow n+ Junctions in Silicon by Arsenic Gas-Phase Doping
- J.F. DeGeolormo
- D.K. Sodana
- et al.
- 1994
- JES
Thin Film Transistors with Graded SiNx Gate Dielectrics
- Yue Kuo
- 1994
- JES
The C49 to C54 Phase Transformation in TiSi2Thin Films
- L. Clevenger
- R. Mann
- 1994
- JES