Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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1 result at EOS/ESD 2002

Test methods, test techniques and failure criteria for evaluation of ESD degradation of analog and radio frequency (RF) technology
- - Steven H. Voldman
  - Brian Ronan
  - et al.
- 2002
- EOS/ESD 2002