Image Analysis Methods for Solder-Ball Inspection in Integrated Circuit Manufacturing
- W.E. Blanz
- Jorge L. C. Sanz
- et al.
- 1988
- IEEE Journal on Robotics and Automation
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.