Layout Influences Testability
- Thomas H. Spencer
- Jacob Savir
- 1985
- IEEE TC
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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12 results for Jacob Savir
On Random Pattern Test Length
- Jacob Savir
- Paul H. Bardell
- 1984
- IEEE TC
Random Pattern Testability
- Jacob Savir
- Gary S. Ditlow
- et al.
- 1984
- IEEE TC
Good Controllability and Observability Do Not Guarantee Good Testability
- Jacob Savir
- 1983
- IEEE TC
A New Empirical Test for the Quality of Random Integer Generators
- Jacob Savir
- 1983
- IEEE TC
The Weighted Syndrome Sums Approach to VLSI Testing
- Zeev Barzilai
- Jacob Savir
- et al.
- 1981
- IEEE TC
Syndrome-Testing of “Syndrome-Untestable” Combinational Circuits
- Jacob Savir
- 1981
- IEEE TC
Syndrome-Testable Design of Combinational Circuits
- Jacob Savir
- 1980
- IEEE TC
Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault Detection
- Jacob Savir
- 1980
- IEEE TC
Detection of Single Intermittent Faults in Sequential Circuits
- Jacob Savir
- 1980
- IEEE TC