COST AND SPEED BARRIERS IN LSI/VLSI TESTING - CAN THEY BE OVERCOME BY TESTABILITY DESIGN? .
- Frank F. Tsui
- 1984
- IEEE ITC 1984
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2 results for Frank F. Tsui
In-Situ Testability Design (ISTD)—A New Approach for Testing High-Speed LSI/VLSI Logic
- Frank F. Tsui
- 1982
- Proceedings of the IEEE