Axiotaxy of CoSi 2 thin films on Si(100) substrates and the effects of Ti alloying
- Ahmet S. Özean
- Karl F. Ludwig Jr.
- et al.
- 2004
- Journal of Applied Physics
Publications
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23 results for K.F. Ludwig Jr.
Texture formation in Ti-Ta alloy disilicide thin films
- A.S. Özcan
- K.F. Ludwig Jr.
- et al.
- 2002
- Journal of Applied Physics
Nucleation and growth kinetics of preferred C54 TiSi 2 orientations: Time-resolved x-ray diffraction measurements
- A.S. Özcan
- K.F. Ludwig Jr.
- et al.
- 2002
- Journal of Applied Physics
Texture of TiSi 2 thin films on Si (001)
- A.S. Özcan
- K.F. Ludwig Jr.
- et al.
- 2002
- Journal of Applied Physics
Phase formation sequences in the silicon-phosphorus system: Determined by in-situ synchrotron and conventional X-ray diffraction measurements and predicted by a theoretical model
- J.R.A. Carlsson
- L. Clevenger
- et al.
- 1997
- Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties
Formation of a crystalline metal-rich suicide in thin film titanium/silicon reactions
- L. Clevenger
- C. Cabral Jr.
- et al.
- 1996
- Thin Solid Films
In situ x-ray diffraction analysis of the C49-C54 titanium silicide phase transformation in narrow lines
- R.A. Roy
- L. Clevenger
- et al.
- 1995
- Applied Physics Letters
Kinetics of true mean-field Ising models and the Langevin equation: A comparison
- Karl F. Ludwig Jr.
- Byungwoo Park
- 1992
- Physical Review B
Instrumentation for millisecond-resolution scattering studies (invited)
- G.B. Stephenson
- K.F. Ludwig Jr.
- et al.
- 1989
- Review of Scientific Instruments
Crystallization of amorphous NiZr2
- M. Sutton
- Y.S. Yang
- et al.
- 1988
- Materials Science and Engineering