In-situ x-ray diffraction and resistivity analysis of CoSi2 phase formation with and without a Ti interlayer at rapid thermal annealing rates
- C. Cabral Jr.
- L. Clevenger
- et al.
- 1994
- MRS Fall Meeting 1994
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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13 results for S. Brauer
X-ray intensity fluctuation spectroscopy observations of critical dynamics in Fe3Al
- S. Brauer
- G.B. Stephenson
- et al.
- 1995
- Physical Review Letters
Formation of a crystalline metal-rich suicide in thin film titanium/silicon reactions
- L. Clevenger
- C. Cabral Jr.
- et al.
- 1996
- Thin Solid Films
Asymmetrically cut crystals as optical elements for highly collimated x-ray beams
- S. Brauer
- G.B. Stephenson
- et al.
- 1995
- Review of Scientific Instruments
A comparison of C54-TiSi2 formation in blanket and submicron gate structures using in situ x-ray diffraction during rapid thermal annealing
- J. Bucchignano
- G.B. Stephenson
- et al.
- 1995
- Journal of Materials Research
In situ x-ray diffraction analysis of the C49-C54 titanium silicide phase transformation in narrow lines
- R.A. Roy
- L. Clevenger
- et al.
- 1995
- Applied Physics Letters
Rapid crystallization of amorphous CoZr and FeB close to eutectic compositions
- H.E Fischer
- S Brauer
- et al.
- 1994
- Materials Science and Engineering A
In situ x-ray-scattering studies of polymorphic crystallization of metal-boron glasses
- S. Brauer
- H.E. Fischer
- et al.
- 1993
- Physical Review B
Time-resolved X-ray scattering studies of rapid crystallization of amorphous metals
- S. Brauer
- H.E. Fischer
- et al.
- 1993
- International Journal of Thermophysics
In situ x-ray studies of rapid crystallization of amorphous NiZr2
- S. Brauer
- J.O. Ström-Olsen
- et al.
- 1992
- Physical Review B