Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

Date

Start

End

Featured collections

Popular topics

15 results for Jing Wang

Characterization and analysis of gate-induced-drain-leakage current in 45 nm CMOS technology
- - Xiaobin Yuan
  - Jae-Eun Park
  - et al.
- 2007
- IIRW 2007
Experimental analysis of on-wafer de-embedding techniques for RF modeling of advanced RFCMOS and BiCMOS technologies
- - Jing Wang
  - Robert Groves
  - et al.
- 2007
- ARFTG 2007
RF characterization and parameter extraction for CMOS device models
- - John J. Pekarik
  - Basanth Jagannathan
  - et al.
- 2007
- SiRF 2007
Gate stack resistance and limits to CMOS logic performance
- - Richard A. Wachnik
  - Sungjae Lee
  - et al.
- 2014
- IEEE TCAS-I
Gate-induced-drain-leakage current in 45-nm CMOS technology
- - Xiaohin Yuan
  - Jae-Eun Park
  - et al.
- 2008
- IEEE T-DMR