Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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162 results for Cyril Cabral

Oxygen stoichiometry in PdO_x and PdO_xPt electrode layers during processing of ferroelectric and high-epsilon perovskites
- - K.L. Saenger
  - C. Cabral Jr.
  - et al.
- 2000
- Journal of Materials Research
Optimization of Ta-Si-N thin films for use as oxidation-resistant diffusion barriers
- - C. Cabral
  - K.L. Saenger
  - et al.
- 2000
- Journal of Materials Research
Mechanisms for enhanced formation of the C54 phase of titanium silicide ultra-large-scale integration contacts
- - J.M.E. Harper
  - C. Cabral Jr.
  - et al.
- 2000
- Annual Review of Materials Science
Fabrication and performance limits of sub-0.1 μm Cu interconnects
- - T.S. Kuan
  - C.K. Inoki
  - et al.
- 2000
- Materials Research Society Symposium-Proceedings
Microstructural analysis of copper interconnections using picosecond ultrasonics
- - James M.E. Harper
  - Sandra G. Malhotra
  - et al.
- 2000
- Materials Research Society Symposium-Proceedings
Thermal stability and oxygen-loss characteristics of Pt(O) films prepared by reactive sputtering
- - K.L. Saenger
  - C. Cabral Jr.
  - et al.
- 1999
- Journal of Applied Physics
Phase formation and resistivity in the ternary system Ti-Nb-Si
- - Aliette Mouroux
  - Marylène Roux
  - et al.
- 1999
- Journal of Applied Physics
Mechanisms for enhanced C54-TiSi₂ formation in Ti-Ta alloy films on single-crystal Si
- - A. Quintero
  - M. Libera
  - et al.
- 1999
- Journal of Materials Research
In situ characterization of titanium silicide formation: The effect of Mo interlayer, temperature ramp-rate, and annealing atmosphere
- - S.-L. Zhang
  - C. Lavoie
  - et al.
- 1999
- Journal of Applied Physics
Al-Ta bilayer as an oxidation resistant barrier for electrode structures in high dielectric constant capacitors
- - A. Grill
  - C. Cabral Jr.
- 1999
- Journal of Materials Research