Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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152 results for Jean L. Jordan-Sweet

Solution-based processing of the phase-change material KSb ₅S₈
- - David B. Mitzi
  - Simone Raoux
  - et al.
- 2006
- Chemistry of Materials
Effects of additive elements on the phase formation and morphological stability of nickel monosilicide films
- - C. Lavoie
  - C. Detavernier
  - et al.
- 2006
- Microelectronic Engineering
N-channel MOSFETs fabricated on He-implanted and annealed SiGe buffer layers
- - P.M. Mooney
  - K. Rim
  - et al.
- 2005
- Solid-State Electronics
Evaluation of thermal stability for CMOS gate metal materials
- - C. Cabral Jr.
  - C. Lavoie
  - et al.
- 2004
- JES
Axiotaxy of CoSi ₂ thin films on Si(100) substrates and the effects of Ti alloying
- - Ahmet S. Özean
  - Karl F. Ludwig Jr.
  - et al.
- 2004
- Journal of Applied Physics
Texture of tetragonal α-FeSi₂ films on Si(001)
- - C. Detavernier
  - C. Lavoie
  - et al.
- 2004
- Physical Review B - CMMP
Formation of Polyimide/Substrate Interfaces: Investigation of Interfacial Chemistry of Polyamic Acid with Surfaces of Silicon, Copper, and Chromium
- - Steven P. Kowalczyk
  - Jean L. Jordan-Sweet
- 2002
- Chemistry of Materials
Effects of alloying elements on cobalt silicide formation
- - C. Lavoie
  - C. Cabral Jr.
  - et al.
- 2002
- Journal of Electronic Materials
The use of in situ X-ray diffraction, optical scattering and resistance analysis techniques for evaluation of copper diffusion barriers in blanket films and damascene structures
- - C. Cabral Jr.
  - C. Lavoie
  - et al.
- 2001
- Thin Solid Films
Scanning x-ray microtopographs of misfit dislocations at SiGe/Si interfaces
- - P.M. Mooney
  - J.L. Jordan-Sweet
  - et al.
- 2001
- Applied Physics Letters