An internal calibration technique for pseudobinary systems by auger electron spectroscopy
- R. Hammer
- N.J. Chou
- et al.
- 1976
- Journal of Electronic Materials
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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30 results for J.M. Eldridge
Room temperature oxidation of lead-indium alloy films
- J.M. Eldridge
- D.W. Dong
- et al.
- 1975
- Journal of Electronic Materials
Absence of non-shorting breakdown behaviour in AlSi3N4Si structures
- N. Klein
- C.M. Osburn
- et al.
- 1975
- Thin Solid Films
The growth of thin PbO layers on lead films. II. Theory
- J.M. Eldridge
- 1973
- Surface Science
The growth of thin PbO layers on lead films. I. Experiment
- J.M. Eldridge
- D.W. Dong
- 1973
- Surface Science
Auger and ellipsometric studies of ultra-thin PbO growth on lead
- N.J. Chou
- J.M. Eldridge
- et al.
- 1973
- Journal of Electronic Materials
Analysis of ultrathin oxide growth on indium
- J.M. Eldridge
- Y.J. Van der Meulen
- et al.
- 1972
- Thin Solid Films
Sodium Ion Drift through Phosphosilicate Glass-SiO2 Films
- J.M. Eldridge
- D.R. Kerr
- 1971
- JES
Effects of Material and Processing Parameters on the Dielectric Strength of Thermally Grown Si02 Films
- N.J. Chou
- J.M. Eldridge
- 1970
- JES
Phosphosilicate Glass Stabilization of FET Devices
- P. Balk
- J.M. Eldridge
- 1969
- Proceedings of the IEEE