Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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22 results for Joseph Angilello

Lattice compression from conduction electrons in heavily doped Si:as
- - G.S. Cargill III
  - J. Angilello III
  - et al.
- 1988
- Physical Review Letters
Disorder in Al-Li-Cu and Al-Mn-Si icosahedral alloys
- - P.A. Heiney
  - P.A. Bancel
  - et al.
- 1987
- Science
Flash X-ray microscopy
- - R.A. McCorkle
  - J. Angilello
  - et al.
- 1979
- Science
AUTOMATED MICRODENSITOMETER FOR DIGITIZING ASTRONOMICAL PLATES.
- - J. Angilello
  - Wei-Hwan Chiang
  - et al.
- 1983
- Astronomical Microdensitometry Conference 1983
Preparation and Characterization of Ruthenium Dioxide Crystals
- - M.W. Shafer
  - R.A. Figat
  - et al.
- 2019
- JES
A Viscous Flow Model to Explain the Appearance of High Density Thermal Si02 at Low Oxidation Temperatures
- - E. Tierney
  - J. Angilello
- 2019
- JES
Etch pits and dislocations in {100} GaAs wafers
- - J. Angilello
  - R.M. Potemski
  - et al.
- 2008
- Journal of Applied Physics
Contact reaction between Si and Pd-W alloy films
- - J.O. Olowolafe
  - K.N. Tu
  - et al.
- 2008
- Journal of Applied Physics
Electromechanical feedback control for lang topography
- - Joseph Angilello
  - Clinton Wood
- 2003
- Review of Scientific Instruments
The interpretation of dislocation contrast in x-ray topographs of GaAs _1-x P_x
- - S. Mader
  - A.E. Blakeslee
  - et al.
- 2003
- Journal of Applied Physics