VF-TLP systems using TDT and TDRT for Kelvin wafer measurements and package level testing
- Evan Grund
- Robert Gauthier
- 2004
- EOS/ESD 2004
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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2 results at EOS/ESD 2004
A compact, timed-shutoff, MOSFET-based power clamp for on-chip ESD protection
- Junjun Li
- Robert Gauthier
- et al.
- 2004
- EOS/ESD 2004