VF-TLP systems using TDT and TDRT for Kelvin wafer measurements and package level testing

Abstract

Very Fast Transmission Line Pulse (VF-TLP) systems described in the literature are Time Domain Reflection (VF-TDR) configurations. Using other TLP configurations, VF-TLP systems can provide new capabilities. A wafer level Kelvin probe system was derived from VF-Time Domain Transmission (VF-TDT). A Test Fixture Board (TFB) using VF-Time Domain Reflection and Transmission (VF-TDRT) enables VF-TLP package level testing. © 2004 ESD Association.