Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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40 results for Sivananda Kanakasabapathy

CMOS compatible MIM decoupling capacitor with reliable sub-nm EOT high-k stacks for the 7 nm node and beyond
- - Takashi Ando
  - Eduard Cartier
  - et al.
- 2016
- IEDM 2016
Technology viable DC performance elements for Si/SiGe channel CMOS FinFTT
- - G. Tsutsui
  - Ruqiang Bao
  - et al.
- 2016
- IEDM 2016
A 7nm FinFET technology featuring EUV patterning and dual strained high mobility channels
- - Ruilong Xie
  - Pietro Montanini
  - et al.
- 2016
- IEDM 2016
Comprehensive study of effective current variability and MOSFET parameter correlations in 14nm multi-fin SOI FINFETs
- - Abhijeet Paul
  - Andres Bryant
  - et al.
- 2013
- IEDM 2013
High performance UTBB FDSOI devices featuring 20nm gate length for 14nm node and beyond
- - Q. Liu
  - M. Vinet
  - et al.
- 2013
- IEDM 2013
Assessment of fully-depleted planar CMOS for low power complex circuit operation
- - Zhibin Ren
  - S. Mehta
  - et al.
- 2011
- IEDM 2011
Challenges and solutions of FinFET integration in an SRAM cell and a logic circuit for 22 nm node and beyond
- - H. Kawasaki
  - V.S. Basker
  - et al.
- 2009
- IEDM 2009
Extremely thin SOI (ETSOI) CMOS with record low variability for low power system-on-chip applications
- - K. Cheng
  - A. Khakifirooz
  - et al.
- 2009
- IEDM 2009
Demonstration of highly scaled FinFET SRAM cells with high-Κ/metal gate and investigation of characteristic variability for the 32 nm node and beyond
- - H. Kawasaki
  - M. Khater
  - et al.
- 2008
- IEDM 2008
A statistical study of magnetic tunnel junctions for high-density spin torque transfer-MRAM (STT-MRAM)
- - R. Beach
  - T. Min
  - et al.
- 2008
- IEDM 2008